There are new exciting opportunities to probe materials at micron and sub-micron scales and to explore the fast changes of materials’ structure and properties in response to external fields, temperature, or pressure. My research is focused on the fundamental understanding and control of properties of ferroelectric and piezoelectric thin-film and multilayer thin-film materials. The crystal structure and dielectric properties of these materials are highly sensitive to externally applied fields. This sensitivity to applied fields is already used in several practical applications including actuator devices and elements of electronic memories. The fundamental understanding of ferroelectric properties of ultrathin films and structure-properties relationships in multilayers and superlattices is essential for furthering the goals of miniaturization, power consumption, and reliability of sensors, nano-electromechanical systems (NEMS), and electronic memories. In my research, the properties of thin films and multilayers are probed by several experimental techniques, which include fast electrical response measurements, time-resolved x-ray scattering, and x-ray microdiffraction.
Education and Degrees Earned
- Ph.D., Physics, St. Petersburg State University, Russia, 05/17/2001
Areas of Research Focus
- Ferroelectric and piezoelectric materials
- Multifunctional materials
- Thin films
- X-ray microdiffraction
- Time-resolved x-ray scattering
- Thin film growth.
- American Physical Society
- Materials Research Society